A CUSUM Control Chart to Monitor Wafer Production Quality

A CUSUM Control Chart to Monitor Wafer Production Quality

Cheng, Sheng-Shu, Yu, Fong-Jung, Hsueh Ming Wang, Steve
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Volume:
35
Language:
english
Journal:
Journal of Information and Optimization Sciences
DOI:
10.1080/02522667.2014.943066
Date:
November, 2014
File:
PDF, 301 KB
english, 2014
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