Requirements for accurate quantification of self-affine roughness using the variogram method
P.H.S.W. Kulatilake, J. Um, G. PanVolume:
35
Year:
1998
Language:
english
Pages:
23
DOI:
10.1016/s0020-7683(97)00308-9
File:
PDF, 1.73 MB
english, 1998