Measurement of electro-optic properties of ferroelectric thin films using the ultimate ellipsometer
Teowee, G., Baertlein, C. D., Simpson, John T., Zhao, Tianji, Mansuripur, M., Quackenbush, E. L., Boulton, J. M., Uhlmann, D. R.Volume:
11
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589508013580
Date:
November, 1995
File:
PDF, 567 KB
english, 1995