Identifying critical success factors in EDA industry using...

International Journal of Computational Intelligence Systems 2015 / 03 Vol. 8; Iss. 2

Identifying critical success factors in EDA industry using DEMATEL method

Sun, Chia-Chi
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Volume:
8
Language:
english
Journal:
International Journal of Computational Intelligence Systems
DOI:
10.1080/18756891.2015.1001945
Date:
March, 2015
File:
PDF, 184 KB
english, 2015
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