An optical measurement technique for studying residual...

An optical measurement technique for studying residual surface charge distribution

Zhu, Y, Takada, T, Tu, D
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Volume:
28
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/28/7/028
Date:
July, 1995
File:
PDF, 1.07 MB
english, 1995
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