Depth profiling of inhomogeneous zirconia films by optical...

Depth profiling of inhomogeneous zirconia films by optical and Rutherford backscattering spectrometric techniques

Khawaja, E E, Durrani, S M A, Daous, M A
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Volume:
32
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/32/4/006
Date:
February, 1999
File:
PDF, 161 KB
english, 1999
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