Study on the defect-related emissions in the light...

Chinese Physics B 2011 / 02 Vol. 20; Iss. 2

Study on the defect-related emissions in the light self-ion-implanted Si films by a silicon-on-insulator structure

Yang, Yu, Yang, Rui-Dong, Li, Liang, Xiong, Fei
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Volume:
20
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/20/2/026802
Date:
February, 2011
File:
PDF, 602 KB
english, 2011
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