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Boundary condition and initial value effects in the reaction–diffusion model of interface trap generation/recovery
Yong, Luo, Daming, Huang, Wenjun, Liu, Mingfu, LiVolume:
30
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/30/7/074008
Date:
July, 2009
File:
PDF, 898 KB
english, 2009