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Influence of the external component on the damage of the bipolar transistor induced by the electromagnetic pulse
Xiaowen, Xi, Changchun, Chai, Xingrong, Ren, Yintang, Yang, Zhenyang, Ma, Jing, WangVolume:
31
Language:
english
Journal:
Journal of Semiconductors
DOI:
10.1088/1674-4926/31/7/074009
Date:
July, 2010
File:
PDF, 90 KB
english, 2010