A geometrical approach for semi-automated crystal centering...

Journal of Applied Crystallography 2013 / 06 Vol. 46; Iss. 3

A geometrical approach for semi-automated crystal centering and in situ X-ray diffraction data collection

Heidari Khajepour, Mohammad Yaser, Lebrette, Hugo, Vernede, Xavier, Rogues, Pierrick, Ferrer, Jean-Luc
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Volume:
46
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/s002188981301008x
Date:
June, 2013
File:
PDF, 676 KB
english, 2013
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