A low-cost, highly reliable SEU-tolerant SRAM: prototype...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

A low-cost, highly reliable SEU-tolerant SRAM: prototype and test results

Calin, T., Vargas, F., Nicolaidis, M., Velazco, R.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.488754
Date:
January, 1995
File:
PDF, 699 KB
english, 1995
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