Single event upset rates on 1 Mbit and 256 Kbit memories:...

IEEE Transactions on Nuclear Science 1995 / Dec. Vol. 42; Iss. 6

Single event upset rates on 1 Mbit and 256 Kbit memories: CRUX experiment on APEX

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.
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Volume:
42
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.489241
Date:
January, 1995
File:
PDF, 1.19 MB
english, 1995
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