Investigations of single-event upsets and charge collection...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Investigations of single-event upsets and charge collection in micro-electronics using variable-length laser-generated charge tracks

Melinger, J.S., McMorrow, D., Buchner, S., Knudson, A.R., Tran, L.H., Campbell, A.B.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685228
Date:
June, 1998
File:
PDF, 825 KB
english, 1998
Conversion to is in progress
Conversion to is failed