Design and test of an integrated cryptochip

IEEE Design & Test of Computers 1991 / 12 Vol. 8; Iss. 4

Design and test of an integrated cryptochip

Hafner, K., Ritter, H.C., Schwair, T.M., Wallstab, S., Deppermann, M., Gessner, J., Koesters, S., Moeller, W.-D., Sandweg, G.
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Volume:
8
Language:
english
Journal:
IEEE Design & Test of Computers
DOI:
10.1109/54.107201
Date:
December, 1991
File:
PDF, 1.35 MB
english, 1991
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