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A microwave broadband technique to measure the complex resistivity of HTS thin films
Tosoratti, N., Fastampa, R., Giura, M., Lenzi, V., Sarti, S., Silva, E.Volume:
11
Language:
english
Journal:
IEEE Transactions on Appiled Superconductivity
DOI:
10.1109/77.919714
Date:
March, 2001
File:
PDF, 439 KB
english, 2001