[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC
Fang, Liquan, Zhong, Yang, van de Donk, HenkYear:
2007
Language:
english
DOI:
10.1109/ats.2007.93
File:
PDF, 425 KB
english, 2007