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[IEEE 1991 International Conference on Circuits and Systems - Shenzhen, China (16-17 June 1991)] 1991 International Conference on Circuits and Systems - Automatic generation of functional test pattern for the SCHOLAR system
Mike Wai-Tak Wong,, Nichols, K.G.Year:
1991
Language:
english
DOI:
10.1109/ciccas.1991.184443
File:
PDF, 439 KB
english, 1991