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[IEEE Eighth IEEE International Power Electronics Conference (CEIP 2002) - Guadalajara, Mexico (20-24 Oct. 2002)] VIII IEEE International Power Electronics Congress, 2002. Technical Proceedings. CIEP 2002. - Comparative analysis of SJ-MOSFET and conventional MOSFET by electrical measurements
Claudio, A., Cotorogea, M., Macedonio, J.Year:
2002
Language:
english
DOI:
10.1109/ciep.2002.1216643
File:
PDF, 578 KB
english, 2002