[IEEE Design, Automation and Test in Europe - Munich,...

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[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Fast and Accurate Transaction Level Modeling of an Extended AMBA2.0 Bus Architecture

Young-Taek Kim,, Taehun Kim,, Youngduk Kim,, Chulho Shin,, Eui-Young Chung,, Kyu-Myung Choi,, Jeong-Taek Kong,, Soo-Kwan Eo,
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Year:
2005
Language:
english
DOI:
10.1109/date.2005.152
File:
PDF, 91 KB
english, 2005
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