[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Decoder-based Decompression for test sets containing don’t cares
Voyiatzis, I., Antonopoulou, H.Year:
2007
Language:
english
DOI:
10.1109/dtis.2007.4449526
File:
PDF, 414 KB
english, 2007