[IEEE 2008 IEEE International Conference on Design and Test...

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[IEEE 2008 IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Era (DTIS '08) - Tozeur (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - FPGA HardCore single processor implementation of RT control applications

Ben Othman, S., Ghrissi, M., Ben Salem, A.K., Ben Saoud, S.
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Year:
2008
Language:
english
DOI:
10.1109/dtis.2008.4540272
File:
PDF, 555 KB
english, 2008
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