[IEEE 2010 Proceedings 60th Electronic Components and...

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[IEEE 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2010.06.1-2010.06.4)] 2010 Proceedings 60th Electronic Components and Technology Conference (ECTC) - Mechanical analysis and reliability enhancement of a Proximity Communication flip chip package

Guenin, Bruce, Shi, Jing
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Year:
2010
Language:
english
DOI:
10.1109/ectc.2010.5490905
File:
PDF, 1.09 MB
english, 2010
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