[IEEE 2014 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Gothenburg (2014.9.1-2014.9.4)] 2014 International Symposium on Electromagnetic Compatibility - RFIP method: Towards a better characterization of integrated circuits immunity
Ayed, A., Dubois, T., Levant, J.-L, Duchamp, G.Year:
2014
Language:
english
DOI:
10.1109/emceurope.2014.6930992
File:
PDF, 722 KB
english, 2014