[IEEE 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Santa Clara, CA, USA (2015.3.15-2015.3.21)] 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity - Measuring a device's susceptibility to LTE: Preliminary approaches
Coder, Jason B., Ladbury, John M., Young, William F.Year:
2015
Language:
english
DOI:
10.1109/emcsi.2015.7107660
File:
PDF, 3.22 MB
english, 2015