[IEEE 17th International Zurich Symposium on Electromagnetic Compatibility - Singapore (2006.02.27-2006.03.3)] 2006 17th International Zurich Symposium on Electromagnetic Compatibility - Parametric analysis of NSA data by the methods of piecewise multiple linear regression
Wang, D.Y., Ken-Huang Lin,, Mon-Na Lo Huang,Year:
2006
Language:
english
DOI:
10.1109/emczur.2006.214971
File:
PDF, 167 KB
english, 2006