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[IEEE Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Grenoble, France (12-16 Sept. 2005)] Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. - Detection of individual traps in silicon nanowire transistors
Hofheinz, M., Jehl, X., Sanquer, M., Molas, G., Vinet, M., Deleonibus, S.Year:
2005
Language:
english
DOI:
10.1109/essder.2005.1546626
File:
PDF, 759 KB
english, 2005