Dual-wavelength point zig-zag scanning of zones on...

Dual-wavelength point zig-zag scanning of zones on thin-layer chromatograms as a tool for quantitative assay

Hiroshi Yamamoto, Takashi Kurita, Jugoro Suzuki, Rikuo Hira, Kiyokazu Nakano, Hideki Makabe, Kazuo Shibata
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Volume:
116
Year:
1976
Language:
english
Pages:
13
DOI:
10.1016/s0021-9673(00)83697-3
File:
PDF, 1021 KB
english, 1976
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