![](/img/cover-not-exists.png)
[IEEE 2012 International Conference on Devices, Circuits and Systems (ICDCS 2012) - Coimbatore (2012.03.15-2012.03.16)] 2012 International Conference on Devices, Circuits and Systems (ICDCS) - Random Dopant induced variability in SOI trigate FINFET: A simulation study
Reddy, G. Rama Pradeep, Bindu, B.Year:
2012
Language:
english
DOI:
10.1109/icdcsyst.2012.6188775
File:
PDF, 1.25 MB
english, 2012