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[IEEE 2010 International Conference on Electrical and Control Engineering (ICECE) - Wuhan, China (2010.06.25-2010.06.27)] 2010 International Conference on Electrical and Control Engineering - The Investigation on Au Nano-particles on Si Wafer after Annealing at Different Temperatures

Zhang, Dongbo, Yang, Lei, Lee, Jae-Wung, Liu, Ze, Liu, Meilin
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Year:
2010
Language:
english
DOI:
10.1109/icece.2010.1167
File:
PDF, 1.59 MB
english, 2010
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