[IEEE 2010 2nd International Conference on Future Computer and Communication - Wuhan, China (2010.05.21-2010.05.24)] 2010 2nd International Conference on Future Computer and Communication - Test system for single sheet iron loss
Ye, Hong, Yu, Huizhong, Gu, WeisiYear:
2010
Language:
english
DOI:
10.1109/icfcc.2010.5497462
File:
PDF, 374 KB
english, 2010