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[IEEE 2008 3rd IEEE Conference on Industrial Electronics and Applications (ICIEA) - Singapore (2008.06.3-2008.06.5)] 2008 3rd IEEE Conference on Industrial Electronics and Applications - The effect of colour space on tracking robustness

Sebastian, Patrick, Voon, Yap Vooi, Comley, Richard
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Year:
2008
Language:
english
DOI:
10.1109/iciea.2008.4582971
File:
PDF, 392 KB
english, 2008
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