[IEEE 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz 2008) - Pasadena, CA (2008.09.15-2008.09.19)] 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves - Electrically active defects and dielectric loss in silicon carbide
Dutta, J. M., Jones, C. R., Parshin, V.V., Garin, B., Polyakov, V.I., Rukovishnikov, A.Year:
2008
Language:
english
DOI:
10.1109/icimw.2008.4665732
File:
PDF, 124 KB
english, 2008