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[IEEE 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials (ICPADM) - Bangalore, India (2012.07.24-2012.07.28)] 2012 IEEE 10th International Conference on the Properties and Applications of Dielectric Materials - Performance of capacitor dielectrics during some of the important tests of IEC standards
Nagamani, H.N., Bhavani Shanker, T., Vaidhyanathan, V., Neelakantan, S., GovindaRao, G.Year:
2012
Language:
english
DOI:
10.1109/icpadm.2012.6318982
File:
PDF, 667 KB
english, 2012