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[IEEE 2014 22nd International Conference on Pattern Recognition (ICPR) - Stockholm, Sweden (2014.8.24-2014.8.28)] 2014 22nd International Conference on Pattern Recognition - Test Point Specific k Estimation for kNN Classifier
Bhattacharya, Gautam, Ghosh, Koushik, Chowdhury, Ananda S.Year:
2014
Language:
english
DOI:
10.1109/icpr.2014.263
File:
PDF, 224 KB
english, 2014