[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - An Investigation on the Permanent Component of NBTI Degradation in a 90nm CMOS Technology
Jin, Lei, Xu, Mingzhen, Tan, ChanghuaYear:
2006
Language:
english
DOI:
10.1109/icsict.2006.306058
File:
PDF, 108 KB
english, 2006