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[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Investigation on thin gate oxide behavior for CMOS devices
Mingyuan Liu,, Yonggen He,, Hung, Albert, Yunzhen Liu,, Bingwu Liu,, Dibao Zhou,, Kai Zheng,, Jinghua Liu,, Jianhua Jua,Year:
2008
Language:
english
DOI:
10.1109/icsict.2008.4734756
File:
PDF, 4.96 MB
english, 2008