[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Nitrided GdTiO as charge-trapping layer for flash memory applications
Tao, Qing-Bo, Lai, P. T.Year:
2012
Language:
english
DOI:
10.1109/icsict.2012.6466677
File:
PDF, 763 KB
english, 2012