![](/img/cover-not-exists.png)
[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Sensitivity improvement in progressive-scan FT-CCDs for digital still camera applications
Van Kuijk, H.C., Bosiers, J.T., Kleimann, A.C., Le Cam, L., Maas, J.P., Peek, H.L., Peschel, C.R.Year:
2000
Language:
english
DOI:
10.1109/iedm.2000.904412
File:
PDF, 468 KB
english, 2000