[IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Session 29: Modeling and simulation variability modeling and technology optimization
Gildenblatt, Gennady, Wei-Kai Shih,Year:
2008
Language:
english
DOI:
10.1109/iedm.2008.4796786
File:
PDF, 99 KB
english, 2008