[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - Models of the ADC transfer function¿sensitivity to noise
Haasz, Vladimir, Slepicka, David, Suchanek, PetrYear:
2008
Language:
english
DOI:
10.1109/imtc.2008.4547104
File:
PDF, 1.22 MB
english, 2008