[IEEE International Conference on Magnetics - Brighton, UK (1990.04.17-1990.04.20)] International Conference on Magnetics - Aging tests of amorphous current transformers used in ground current transformers used in ground fault interrupters
Nafalski, A., Matras, G., Wac-Wlodarczyk, A., Stryczewska, H.Year:
1990
DOI:
10.1109/intmag.1990.734512
File:
PDF, 93 KB
1990