[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Effect of metal routing on the ESD robustness of dual-direction silicon controlled rectifier
Wei Guo,, Li, Mingliang, Dong, ShurongYear:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232637
File:
PDF, 4.45 MB
english, 2009