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[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Application based reliability assessment and qualification methodology for medical ICs
Zhu, Xiaowei, Vasanth, Karthik, Xu, Xiaochen, Smyth, Charles, Rhoton, BrentYear:
2011
Language:
english
DOI:
10.1109/irps.2011.5784482
File:
PDF, 1.67 MB
english, 2011