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[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Intrinsic correlation between PBTI and TDDB degradations in nMOS HK/MG dielectrics
Yang, Jiaqi, Masuduzzaman, Muhammad, Joshi, Kaustubh, Mukhopadhyay, Subhadeep, Kang, Jinfeng, Mahapatra, Souvik, Alam, Muhammad A.Year:
2012
Language:
english
DOI:
10.1109/irps.2012.6241855
File:
PDF, 365 KB
english, 2012