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[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
Cho, Choongyeun, Kim, Daeik, Kim, Jonghae, Plouchart, Jean-Olivier, Lim, Daihyun, Cho, Sangyeun, Trzcinski, RobertYear:
2007
Language:
english
DOI:
10.1109/isqed.2007.8
File:
PDF, 418 KB
english, 2007