[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - RTS noise amplitude and electron concentration in MOSFETs
Pavelka, J., Sikula, J., Chvatal, M., Tacano, M., Toita, M.Year:
2010
Language:
english
DOI:
10.1109/miel.2010.5490439
File:
PDF, 423 KB
english, 2010