[IEEE MILCOM 2006 - Washington, DC, USA...

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[IEEE MILCOM 2006 - Washington, DC, USA (2006.10.23-2006.10.25)] MILCOM 2006 - Accurate Capture Models and Their Impact on Random Access in Multiple-Destination Networks

Nguyen, Gam, Wieselthier, Jeffrey, Ephremides, Anthony
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Year:
2006
Language:
english
DOI:
10.1109/milcom.2006.302125
File:
PDF, 6.95 MB
english, 2006
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