[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Measurement of dielectric properties at high-temperatures in real-time with cylindrical cavity
Canos, Antoni J., Penaranda-Foix, Felipe L., Catala-Civera, Jose M., Garcia-Banos, BeatrizYear:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5515877
File:
PDF, 1.04 MB
english, 2010