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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - DSP assisted low cost IQ mismatch measurement and compensation using built in power detector
Sen, Shreyas, Devarakond, Shyam Kumar, Chatterjee, AbhijitYear:
2010
Language:
english
DOI:
10.1109/mwsym.2010.5516991
File:
PDF, 1.44 MB
english, 2010