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[IEEE 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Philadelphia, PA, USA (2009.06.7-2009.06.12)] 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) - Carrier depletion and grain misorientations on individual grain boundaries of polycrystalline Si thin films
Jiang, C.-S., Moutinho, H.R., Liu, F., Romero, M.J., Al-Jassim, M.M.Year:
2009
Language:
english
DOI:
10.1109/pvsc.2009.5411640
File:
PDF, 9.90 MB
english, 2009